Method for correcting non-linearities of an output signal of an electrical component, particularly a measuring transducer

ABSTRACT

A method for correcting non-linearities of an output signal of an electrical component with the aid of a characteristics map that is defined by discrete interpolation points. In this context, the adjacent interpolation points of the characteristics map are ascertained as a function of at least one signal influencing the non-linearities of the output signal. Interpolation is carried out between these interpolation points, and a corresponding correction signal is ascertained as a function of the or each signal by an interpolation. The output signal of the electrical component is corrected as a function of the correction signal. To improve the correction of non-linear transfer characteristics and/or temperature responses of the electrical component, it is proposed that the or each signal for addressing the characteristics map be high-pass filtered, and the correction signal be ascertained as a function of the or each signal by the interpolation and a subsequent low-pass filtering.

FIELD OF THE INVENTION

[0001] The present invention relates to a method for correcting non-linearities of an output signal of an electrical component with the aid of a characteristics map that is defined by discrete interpolation points. In this context, the adjacent interpolation points of the characteristics map are ascertained as a function of at least one signal influencing the non-linearities of the output signal, and an interpolation is carried out between these interpolation points. As a function of the or each signal, a corresponding correction signal is ascertained by an interpolation, and the output signal of the electrical component is corrected as a function of the correction signal.

[0002] The present invention also relates to a digital sensor evaluation circuit of an electrical component for correcting non-linearities of an output signal of the component. The evaluation circuit includes

[0003] a characteristics-map memory in which discrete interpolation points of a characteristics map are stored,

[0004] means for ascertaining the adjacent interpolation points of the characteristics map as a function of at least one signal influencing the non-linearities of the output signal,

[0005] means for ascertaining a corresponding correction signal as a function of the or each signal by an interpolation, and

[0006] means for correcting the output signal of the electrical component as a function of the correction signal.

[0007] Moreover, the present invention relates to a measuring transducer for converting chemical or physical quantities, detected by a sensor, into electrical quantities. The evaluation circuit includes:

[0008] a characteristics-map memory in which discrete interpolation points of a characteristics map are stored,

[0009] means for ascertaining the adjacent interpolation points of the characteristics map as a function of at least one signal influencing the non-linearities of the output signal,

[0010] means for ascertaining a corresponding correction signal as a function of the or each signal by an interpolation, and

[0011] means for correcting the output signal of the electrical component as a function of the correction signal.

[0012] Finally, the present invention also relates to a computer program which is executable on a computing element, particularly on a microprocessor.

BACKGROUND INFORMATION

[0013] Sensors supply information about measurable physical or chemical (mostly non-electrical) quantities to control units in automobile applications, in industrial installation controls or in medical technology applications. Measuring transducers convert the measured quantities into electrical quantities (voltage, current, resistance, capacitance, frequency, etc.). As a rule, the conversion is subject to relatively large manufacturing tolerances of the measuring transducer and non-ideal situations such as, for example, temperature responses. In addition, the electrical quantities are typically very small and therefore not suitable for transmitting directly to a control unit. That is why, mounted at the measuring transducer is a signal evaluation circuit which conditions the electrical signal and routes it via an analog or digital interface to the control unit. This signal evaluation circuit is able to correct, for example, sensitivity, offset and temperature response in a part-specific manner. The data necessary for this purpose are stored in a non-volatile memory.

[0014] Such sensor evaluation circuits are increasingly designed as application-specific integrated circuits (so-called ASICs). Purely analog evaluation circuits with D/A (digital/analog) converters for the coefficients are customary. Digital evaluation circuits are also being used with increasing frequency, in which the electrical signal (with or without analog pre-corrections, for example, of the offset) is A/D (analog/digital)-converted and then subjected to digital signal corrections. Since the typical limiting frequencies of the measured quantities often lie below one kilohertz, but high demands are placed on the resolution of the sensors, the use of a so-called delta-sigma converter (delta-sigma modulator or sigma-delta modulator) presents itself for the A/D conversion of the electrical equivalent parameters which play a key role in such a system. This holds true in particular for modern IC processes, in which the component density of digital circuits and the achievable switching speeds are increasing, while the analog qualities of the components are more likely decreasing. An example for a digital sensor evaluation circuit based on delta-sigma converters is known, for example, from the German Patent 100 34 813.

[0015] Furthermore, when working with measuring transducers having non-linear transfer characteristics and/or temperature responses, non-linear corrections in the evaluation circuit may also become necessary. Here, characteristics-map adjustments offer the greatest degree of freedom. This is elucidated using a two-dimensional characteristics map shown in FIG. 2 as example: There, a physical measured quantity y_1 is dependent on two signals x_1 and x_2 by way of a non-linear function y_1=f(x_1, x_2). For example, x_1 could be an output signal of a measuring bridge and x_2 could be a temperature signal. The grid points of the curved plane, described by function f(x_1, x_2) in FIG. 2, may be stored in a characteristics-map memory. For each concrete measured-value pair (x_1, x_2), which generally lies between these grid points, the evaluation circuit must then undertake an interpolation with the four surrounding grid points as interpolation points, in order to ascertain an approximatively correct output value. The denser the interpolation points and the smaller the curve of the function in the respective direction, the more precise the interpolation becomes. For this reason, in FIG. 2, for example, the interpolation point density in direction x_2 is selected to be less than in direction x_1. In principle, the dimension of the characteristics map, thus, the number of input quantities x_i, is arbitrary, but often the cases occur one-dimensionally (so-called characteristic curve) and two-dimensionally.

[0016] The interpolation is accomplished with the four surrounding grid points of the characteristics map, often by the use of arithmetic-logic units. Thus, a microprocessor having suitable software, a digital signal processor (so-called DSP) or a special RISC (reduced instruction set computing)-processor may be used. However, often the costs associated with the implementation of such processor design approaches are not acceptable, particularly when using processes that employ less densely packed ICs, which, for instance, are used for applications in motor vehicles because of demands on the dielectric strength and reliability.

[0017] Another widely prevalent approach for non-linear corrections in the evaluation circuit is derived directly from a customary linear adjustment. In the linear case, signals are multiplied by coefficients, established in the adjustment procedure, and summed. For a non-linear adjustment, the coefficients may also come from a characteristics-map memory which is addressed as a function of signal and/or temperature. However, when working with a finite number of interpolation points, this leads to (mostly unwanted) sudden changes in the output signal when the addressing signal passes the interpolation points. Here, the use of oversampling methods may provide a remedy. In B. J. Hosticka: “CMOS Sensor Systems”, Sensors and Actuators A66 (1998), pp. 335-341, particularly p. 340, an oversampled temperature signal is used for addressing a characteristics map, which supplies coefficients for an analog signal-evaluation channel. The bandwidth of this analog channel is so low that a large part of the quantization noise of the interpolation-point quantization is filtered out again.

SUMMARY OF THE INVENTION

[0018] An object of the present invention is to improve the correction of non-linear transfer characteristics and/or temperature responses of electrical components, particularly measuring transducers.

[0019] To achieve this objective, the present invention proposes, starting from the evaluation circuit of an electrical component of the type indicated at the outset, that the or each signal for addressing the characteristics map be high-pass filtered, and the corrected output signal ascertained with the aid of the characteristics map be low-pass filtered.

[0020] As a further design approach for achieving the objective of the present invention, it is proposed, starting from the sensor evaluation circuit of the type indicated at the outset, that the evaluation circuit have means for the high-pass filtering of the or each signal for addressing the characteristics map, and means for the low-pass filtering of the corrected output signal ascertained with the aid of the characteristics map.

[0021] Finally, as a still further design approach for achieving the objective of the present invention, it is proposed, starting from the measuring transducer of the type indicated at the outset, that the evaluation circuit have means for the high-pass filtering of the or each signal for addressing the characteristics map, and means for the low-pass filtering of the corrected output signal ascertained with the aid of the characteristics map.

[0022] According to the invention, the correction of non-linear transfer characteristics and/or temperature responses of measuring transducers is consequently expanded to purely digital characteristics mappings of any dimension. The essence of the invention is the addressing of the characteristics-map memory using oversampled signals which have experienced noise forming with a high-pass characteristic by the use of delta-sigma modulators. After the characteristics mapping, a large part of the quantization noise may be removed again from the output signal by low-pass filtering. This may be equated with an interpolation via the adjacent interpolation points. A part of the noise forming necessary for this method is supplied by the use of delta-sigma modulators as A/D converters for the input signals. If this is not sufficient because of restrictions in the modulator order, in the number of interpolation points and in the memory access rate, then a highly efficient integration of a decimation filter and a digital delta-sigma modulator may be used. With the aid of a decimation filter, the sampling rate may be changed while avoiding aliasing effects. In the present case, the decimation filter is used for reducing the sampling rate, in order to reduce the hardware and computing expenditure for the non-linear correction. The size of the characteristics map may be further reduced through the separate treatment of linear adjustment components by the use of linear bypass circuits.

[0023] The advantages of the present invention compared to part-analog design approaches lie in the absolute drift stability of the digital part, the improved utilization of modern IC processes, and in the improved testability. The advantage compared to processor-based design approaches is the lower area outlay in the case of moderately densely packed IC processors, as are used particularly in motor-vehicle applications.

[0024] Implementing the method of the present invention in the form of a computer program for a computer is particularly important. The computer program is executable on a computing element, particularly on a microprocessor, and is suitable for carrying into effect the method according to the present invention. The computer program represents the invention in the same way as the method, for whose execution the computer program is suitable. The computer program is preferably stored on a memory element for a computer. In particular, an electrical, magnetic and/or optical storage medium, e.g. a read-only memory, a random-access memory, a flash memory, a diskette, a compact disc (CD) or the like may be used as memory element.

BRIEF DESCRIPTION OF THE DRAWINGS

[0025]FIG. 1 shows an example for a possible use of the present invention in a measuring transducer of a sensor.

[0026]FIG. 2 shows a two-dimensional characteristics map.

[0027]FIG. 3 shows a block diagram of a measuring transducer according to the invention with a characteristics-map adjustment of an N-dimensional, N-fold characteristics map according to a first preferred specific embodiment.

[0028]FIG. 4a shows a block diagram of a decimation filter of the measuring transducer from FIG. 3.

[0029]FIG. 4b shows a block diagram of a digital delta-sigma modulator of the measuring transducer from FIG. 3.

[0030]FIG. 5 shows a block diagram of a measuring transducer according to the invention with a characteristics-map adjustment of an N-dimensional, N-fold characteristics map according to a second preferred specific embodiment.

[0031]FIG. 6a shows a block diagram of a decimation modulator of the measuring transducer from FIG. 5 according to a first preferred specific embodiment.

[0032]FIG. 6b shows a block diagram of a decimation modulator of the measuring transducer from FIG. 5 according to a second preferred specific embodiment.

[0033]FIG. 7 shows a block diagram of a measuring transducer according to the invention with a characteristics-map adjustment of an N-dimensional, N-fold characteristics map according to a third preferred specific embodiment.

[0034]FIG. 8 shows a block diagram of a bypass of the measuring transducer from FIG. 7.

DETAILED DESCRIPTION

[0035] In FIG. 1, a sensor is designated by reference numeral 8. Sensor 8 supplies, for example, information about measurable physical or chemical (mostly non-electrical) quantities 10 to a control unit 9 in automobile applications, in industrial installation controls or in medical technology applications. A measuring transducer 11 converts measured quantities 10 into electrical quantities (voltage, current, resistance, capacitance, frequency, etc.) 18. As a rule, the conversion is subject to relatively large production tolerances of measuring transducer 11 and non-ideal situations such as temperature responses. In addition, electrical quantities 18 are typically very small and therefore not suitable for transmitting directly to control unit 9. That is why, provided at measuring transducer 11 is a signal-evaluation circuit 12 which conditions electrical signal 18 and routes conditioned signal 20 via an analog or digital interface to control unit 9. This signal-evaluation circuit 12 is able to correct, for example, sensitivity, offset and temperature response in a part-specific manner. Evaluation circuit 12 ascertains a correction value y_i which is combined in a functional block 19 with electrical quantity 18, for example, by addition or multiplication, to form output signal 20.

[0036]FIG. 3 shows the basic construction of a signal evaluation circuit 12 according to the invention for a measuring transducer 11 in the case of an M-fold, N-dimensional characteristics mapping with analog input signals x_1, . . . , x_N (represented up to N=2) and output signals y_1, . . . , y_M (represented up to M=2). Input signals x_1, . . . , x_N are analog electrical quantities which come from sensor 8. Input signals x_i are signals which influence the non-linearities of output signal 18 of measuring transducer 11. In the exemplary embodiment shown in FIG. 1, electrical quantity 18 at the output of measuring transducer 11 is also one of input signals x_i. It is thereby possible to ascertain a correction value y_i as a function of electrical quantity 18. However, by weighting the supply of electrical quantity 18 to evaluation circuit 12 with zero, a correction value y_i may also be ascertained independently of quantity 18. A further example for an input quantity x_i is, for instance, a temperature (e.g. the ambient temperature or the temperature of the medium or component part whose physical or chemical quantity 10 was measured).

[0037] Output signals y_1, . . . , y_M are analog or digital electrical quantities which may be supplied to control unit 9 via any analog or digital interfaces. The designations n_k,j indicate the word lengths of the respective fixed-decimal-point digital signals, k designating the position from left to right in the signal flow and j designating the specific channel (1, . . . , N at the input and 1, . . . , M at the output). Between the blocks, the respective sampling frequencies f_S1, . . . , f_S3 are indicated, no differentiation being made according to channels for the sake of simplicity. Actually, however, frequencies f_S1 and f_S3 may be selected in a channel-specific manner, in order to ensure ideal adaptation to the resolution and limiting-frequency conditions of the respective channels. Merely in the case of f_S2 is only one fixed sampling rate possible, namely, an access rate to a characteristics-map memory 2.

[0038] Input signals x_i are converted by A/D (analog/digital) converters 1 into digital signals having word lengths n_1,i at the rate of f_S1. Here, low-pass delta-sigma converters are preferably used, because they already carry out a high-pass noise forming of their quantization noise. n_1,i is typically equal to 1. Correspondingly, f_S1 must be selected to be large compared to the required system bandwidth, in order to ensure oversampling sufficient for a required resolution. f_S1 lies typically approximately in the area of factor 100 of the minimal sampling rate. As a rule, the oversampling is easily attainable in the sensor suite, since the signal bandwidths are more likely low there.

[0039] Typically, actual characteristics map 13 is stored in a non-volatile memory 2, for instance, an EEPROM (electronically erasable programmable read-only memory) to permit the adjustment of measuring transducer 11. The adjustment is preferably carried out at the end of sensor production. To store characteristics map 13, instead of non-volatile memory 2, a volatile memory, for instance, a RAM (random-access memory) may be used, whose contents are downloaded into sensor 8 after each switch-on of the energy supply of control unit 9. Since the method of the present invention lives from the oversampling of signals, a highest possible access rate f_S2 to characteristics-map memory 2 is desirable. However, this rate is technically limited. That is why a reduction of the sampling rate from f_S1 to f_S2 is necessary when using low-order delta-sigma A/D converters 1. This may be implemented, as shown in FIG. 3, using a decimation filter 3 for avoiding aliasing effects. In this context, the word length is increased from n_1,i to n_2,i.

[0040] The number of interpolation points of the dimension i is adapted to the non-linearity of the characteristics mapping to be displayed. Word length n_2,i should be adapted to the number of interpolation points. 2^(n) ^(_(—)) ^(2,i) is markedly greater than the desired number of interpolation points. Rather, a word length n_3,i is useful, which is equal to the next-larger integer value than the logarithm to base 2 of the number of interpolation points specified. As a rule, this number is selected as the 2nd exponent, to efficiently utilize memory 2. However, other values may likewise be easily realized by the use of limiter circuits. To come down from n_2,i to n_3,i, first of all, a simple rounding-off is conceivable. However, this leads to unformed, approximatively white quantization noise which can no longer be separated from the useful signal in the signal band. Thus, as a rule, the resolution demands cannot be met.

[0041] A better possibility is a word-length reduction with high-pass noise forming in a digital delta-sigma modulator 4. Alternatively, delta-sigma A/D converter 1 may of course also be implemented at a higher order right at the outset. In the case of an N-dimensional characteristics mapping, one now has available N digital signals of the word lengths n_3,i with the data rate f_S2. In a simple bit-by-bit joining operation, these data may be converted into n_3 bit long addresses of characteristics-map memory 2. Suitable filing of the data in this memory 2 ensures that the correct characteristics-map data are made available for each interpolation-point combination, thus for each address (see also FIG. 2). Depending on the required resolution of the characteristics-map data and depending on the number M of the individual characteristics maps, which are queried by a single access of the rate f_S2, an address logic must query a plurality of successive words from memory 2 for each address. This means that one or more bits of the lowest significance must still be added to the address word of length n_3 in order to obtain the actual memory address.

[0042] Ultimately, data of the word length n_4 are available at the output of characteristics-map memory 2 at the rate f_S2. They may now be split into M individuals signals of word lengths n_4,j. If a value x_i lies between two interpolation points (see FIG. 2), the oversampling with noise forming leads to the quasi-random change of the address between adjacent interpolation points, the time average describing the exact value x_i. At the output of characteristics-map memory 2, the data change in the same manner over time between characteristics maps 13 which are allocated to these interpolation points. Here, the time average indicates a value interpolated between the interpolation points. The amplitude of the noise about the value x_i in units of interpolation points is a function of the order of the noise-forming used. Thus, higher-order interpolations are also possible. The time-averaging which brings about the interpolation may be carried out using low-pass filters 5 downstream of characteristics-map memory 2. As a rule, here one will once again reduce the sampling rate from f_S2 to f_S3, as well, for which further decimation filters 6 are needed.

[0043] An important aspect of the present invention is that the word length of characteristics-map data n_4,j is selected to be typically higher than would be necessary for the representation of the resolution in the case of the oversampling given by f_S2 in comparison to the signal bandwidth. This is necessary in order to ensure the desired accuracy of the adjustment.

[0044] From the description of the method according to the invention, it becomes clear that it assumes the selection of equidistant interpolation points; the number of interpolation points in each dimension i may be selected independently of one another. However, the interpolation points for each of the M individual characteristics maps are of necessity the same; only the characteristics-map data for these interpolation points differ. An essential point in the dimensioning is the correlation between the attainable resolution for a given characteristics-map size, and the degree of non-linearity of the characteristics mapping. Due to this non-linearity, noise components from higher frequency ranges are mirrored into the wanted band. These effects are only ascertainable by numerical simulation. So-called pattern noise effects have a particularly disturbing effect here. In this connection, the use of so-called dithering techniques in digital delta-sigma modulator 4 may be considered.

[0045] There is a very efficient hardware-saving method for implementing decimation filter 3 and digital delta-sigma modulator 4 upstream of characteristics-map memory 2. FIG. 4a shows the typical architecture of a so-called sinc² decimation filter. In this context,

[0046] z_i=expo*2*pi*f/f_Si) designates the spectral variable of the z-transformation for specific sampling range i. D indicates decimation factor f_S1/f_S2. A typical implementation of a digital n_b-bit 2nd-order delta-sigma modulator 2 having loop parameters a_1, a_2, b_1 and c_1 is given in FIG. 4b. In this case, the quantizer may be realized by the simple dropping of low-significance bits. The loop parameters are represented using the csd form, from a few shifting and addition operations.

[0047]FIG. 5 shows the basic structure of a signal-evaluation circuit 12, according to the present invention, of a measuring transducer 11 in the case of an M-fold, N-dimensional characteristics mapping with analog input signals x_1, . . . x_N (represented up to N=2) and output signals y_1, . . . , y_M (represented up to M=2) according to an alternative specific embodiment. In this case, the characteristics mapping is carried out using a decimation modulator 7, instead of decimation filter 3 and digital delta-sigma modulator 4 as for measuring transducer 11 from FIG. 3. Possible block diagrams of decimation modulator 7 are shown in FIGS. 6a and 6 b.

[0048]FIG. 6a shows a 2nd order decimation modulator. Using the Shannon theorem, one is able to show that both the signal-transmission function and the noise-transmission function of this decimation modulator 7 are equal to the series connection, depicted in FIG. 6b, of decimator 3 and digital delta-sigma modulator 4 according to FIGS. 4a and 4 b. Because of the strong non-linearity of the quantization operation, the function must be checked by numerical simulations. Such simulations confirm the equivalence postulated in FIG. 6b. Both blocks 14, 15 in FIG. 6b with transfer functions z_1 and z_2 represent merely negative delays, which means that the group running time through decimation modulator 7 is shorter than that through the series connection of decimation filter 3 and modulator 4. Just by the fact that instead of six register banks, one only needs two, one sees the savings potential of the approach from FIG. 5.

[0049] If one assumes that an output signal y_j is essentially linearly dependent upon an input signal x_j (for i=j) and has only insignificant non-linear disturbances as a function of all input signals x_i, where i=1, . . . , N, it is possible to markedly reduce the memory requirements of characteristics-map memory 2, by producing a linear bypass branch 16 past characteristics-map memory 2. This is depicted schematically in the block diagram in FIG. 7. Each bypass branch 16 includes a multiplication by a fixed factor and an addition of a fixed offset value (see FIG. 8). The sequence of multiplication and addition may be selected as desired; however, because of the word lengths occurring, the version with the multiplication prior to the addition has advantages with regard to the expenditure connected therewith. For the adjustment of sensor 8, the factor and the offset value must likewise be stored in a non-volatile memory. In order to properly scale the dynamics of the non-linear characteristics-map data, prior to the addition to the bypass data of word length n_6,j, the multiplication by a hard-wired factor j (blocks 17 in FIG. 7) is necessary. As a rule, this will only be a binary shift operation.

[0050] Thus, characteristics-map memory 2 contains only those interpolation points of characteristics map 13 which are needed for a non-linear fine adjustment of y_j as a function of x_i, and for the dependencies of y_j on x_i, where i is not equal to j. Therefore, n_4,j, and thus the size of characteristics-map memory 2, may be selected to be smaller for the specific embodiment in FIG. 7 than for the implementation without bypass branches 16 (e.g. FIG. 3 or 5).

[0051] In the schematic block diagrams (FIGS. 3, 5 and 7), simple scaling and limiting functions, which are necessary or useful in practice, were not shown for reasons of clarity. Thus, for example, downstream of delta-sigma A/D converter 1, a rough offset- and sensitivity preadjustment is useful, in order to better utilize characteristics map 13. 

What is claimed is:
 1. A method for correcting non-linearities of an output signal of an electrical component with the aid of a characteristics map that is defined by discrete interpolation points, comprising: ascertaining the interpolation points of the characteristics map that are adjacent as a function of at least one signal influencing the non-linearities of the output signal, wherein the at least one signal is for addressing the characteristics map; performing an interpolation between the ascertained adjacent interpolation points; determining a corresponding correction signal as a function of the at least one signal by the interpolation; correcting the output signal of the electrical component being corrected as a function of the correction signal; high-pass filtering the at least one signal; and ascertaining the correction signal as a function of the at least one by the interpolation and a subsequent low-pass filtering.
 2. The method as recited in claim 1, further comprising: oversampling the at least one signal.
 3. The method as recited in claim 1, wherein: the high-pass filtering of the at least one signal is performed in accordance with a delta-sigma modulator.
 4. The method as recited in claim 1, further comprising: reducing a sampling rate of the at least one signal.
 5. The method as recited in claim 1, further comprising: reducing a sampling rate of the correction signal.
 6. The method as recited in claim 4, wherein: the reducing of the sampling rate of the at least one signal is performed by a decimation filter.
 7. The method as recited in claim 5, wherein: the reducing of the sampling rate of the correction signal is performed by a decimation filter.
 8. A digital sensor evaluation circuit of an electrical component for correcting non-linearities of an output signal of the electrical component, the evaluation circuit comprising: a characteristics-map memory in which discrete interpolation points of a characteristics map are stored; an arrangement for ascertaining the interpolation points of the characteristics map that are adjacent as a function of at least one signal influencing the non-linearities of the output signal, the at least one signal being capable of addressing the characteristics map; an arrangement for ascertaining a corresponding correction signal as a function of the at least one signal by an interpolation; an arrangement for correcting the output signal of the electrical component as a function of the correction signal; an arrangement for performing a high-pass filtering of the at least one signal; and an arrangement for ascertaining the correction signal as a function of the at least one signal by the interpolation and a subsequent low-pass filtering.
 9. The evaluation circuit as recited in claim 8, further comprising: an arrangement for oversampling the at least one signal.
 10. The evaluation circuit as recited in claim 8, further comprising: a delta-signal modulator for performing the high-pass filtering of the at least one signal.
 11. The evaluation circuit as recited in claim 8, further comprising: an arrangement for reducing a sampling rate of the at least one signal.
 12. The evaluation circuit as recited in claim 8, further comprising: an arrangement for reducing a sampling rate of the correction signal.
 13. The evaluation circuit as recited in claim 11, further comprising: a decimation filter for performing the reducing of the sampling rate of the at least one signal.
 14. The evaluation circuit as recited in claim 12, further comprising: a decimation filter for performing the reducing of the sampling rate of the correction signal.
 15. A measuring transducer for converting one of physical quantities and chemical quantities, detected by a sensor, into an electrical output signal, comprising: a digital sensor evaluation circuit for correcting non-linearities of an output signal of the measuring transducer, the evaluation circuit including: a characteristics-map memory in which discrete interpolation points of a characteristics map are stored, an arrangement for ascertaining the interpolation points of the characteristics map that are adjacent as a function of at least one signal influencing the non-linearities of the output signal, the at least one signal being capable of addressing the characteristics map, an arrangement for ascertaining a corresponding correction signal as a function of the at least one signal by an interpolation, an arrangement for correcting the output signal of the electrical component as a function of the correction signal, an arrangement for performing a high-pass filtering of the at least one signal, and an arrangement for ascertaining the correction signal as a function of the at least one signal by the interpolation and a subsequent low-pass filtering.
 16. A storage medium for storing a computer program that when executed on a computing element achieves a performance of: ascertaining interpolation points of a characteristics map that are adjacent as a function of at least one signal influencing non-linearities of an output signal of an electrical component, wherein the at least one signal is for addressing the characteristics map; performing an interpolation between the ascertained adjacent interpolation points; determining a corresponding correction signal as a function of the at least one signal by the interpolation; correcting the output signal of the electrical component being corrected as a function of the correction signal; high-pass filtering the at least one signal; and ascertaining the correction signal as a function of the at least one by the interpolation and a subsequent low-pass filtering.
 17. The storage medium according to claim 16, wherein: the computing element includes a microprocessor. 